Abstract

Kirk and Fred discussing a recent opinion article in the New York Times on technology waste.

Key Points

Join Kirk and Fred as they discuss the challenge of the rapid introduction of new technologies and disposal of the old technology.
Topics include:

• Sometimes we look for an excuse to upgrade to newer technologies, even though a device can be repaired, and after repair still have significant life left in the electronics.
• Different products have different times to technology obsolescence, and many automobile  replacements are due to the better safety technologies.
• Some technologies would  make  engineering tradeoffs to make internal electronics in smartphones more repairable would also make them non-competitive.

Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques to field data analysis approaches.

SOR 656 Reliability is GreenKirk Gray

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Show Notes

Here is the link to the NYT Opinion article referenced in this podcast “Your Smartphone Should be Built to Last” by Damon Beres

Please click on this link to access a relatively new analysis of traditional reliability prediction methods article from the US ARMY and CALCE titled  “Reliability Prediction – A Continued Reliance on a Misleading Approach”

For more information on the newest discovery testing methodology here is a link to the book “Next Generation HALT and HASS: Robust design of Electronics and Systems” written by Kirk Gray and John Paschkewitz.