Trick Questions

Abstract

Kirk and Fred discuss questions that can reveal some job candidates’ knowledge or lack of understanding of new product reliability development

Key Points

Join Kirk and Fred as they discuss which questions and how to ask them in a potential reliability engineering position can distinguish those who really understand the process of reliability development.

Topics include:

• An easy question to quickly find out if a candidate understands HALT (a Limit test) is “How do you pass HALT?”
• Those companies with top executives who have direct experience in product development and hands-on experience in manufacturing have the best understanding of the need to do HALT. They can be more open to supporting change.
• Many times, we see that there should be a better understanding of process reliability risks, as we have seen workers handling populated circuit boards without using protection to prevent ESD (electrostatic discharge).
• If you want to help a company adopt a new process, such as testing to empirical operational limits (HALT) instead of specifications, you will need to convince many skeptics, so you will need to have supporting data and supporting upper management.

Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques to field data analysis approaches.

Speaking Of Reliability: Friends Discussing Reliability Engineering Topics | Warranty | Plant Maintenance

SOR 1144 Trick Questions

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Show Notes

Please click on this link to access a relatively new analysis of traditional reliability prediction methods article from the US ARMY and CALCE titled  “Reliability Prediction – Continued Reliance on a Misleading Approach”. It is in the public domain, so please feel free to distribute it. Attempting to predict reliability is a misleading and costly approach to use for developing a reliable system.

If you would like to learn more about using HALT (Highly Accelerated Limit Tests) and HASS (Highly Accelerated Stress Screens), please follow this link to the book “Next Generation HALT and HASS: Robust design of Electronics and Systems,” written by Kirk Gray and John Paschkewitz. It can also be found on Amazon Books at this link.