Abstract

Kirk and Fred discuss the tradeoffs involved in developing a reliable product.

Key Points

Join Kirk and Fred as they discuss how, during product development, we have to limit the amount of robustness we can achieve so that it is on schedule and cost-competitive.

Topics include:

• HALT is to find weaknesses in new products using standard materials and processes for most common electronics up to the technology’s fundamental limit. Some products, such as oil exploration tools as Measurement While Drilling (MWD) electronics and interplanetary robots, have unique extreme conditions that are the exceptions.
• Experience conducting and analyzing HALT processes results in understanding the capabilities of electronic material’s stress limits and their relevance to past failures.
• HALT is not just breaking and fixing products during development. Engineers should use multiple samples for any HALT process to confirm a low limit. Reliability engineers must justify every limit cause and proposed improvement by tying the potential reliability risk of not improving to known field failure issues.

Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques to field data analysis approaches.

SOR 1042 Reliability TradeoffsKirk Gray

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Show Notes

Please click on this link to access a relatively new analysis of traditional reliability prediction methods article from the US ARMY and CALCE titled “Reliability Prediction Continued Reliance on a Misleading Approach.” It is in the public domain, so please distribute freely. Attempting to predict reliability is a misleading and costly approach to ecording of Kirk Gray’s Hobbs Engineering 8 (two 4 hour sessions) hour Webinar “Rapid and Robust Reliability Development 2022 HALT & HASS Methodologies Online Seminar” from this link.

For more information on the newest discovery testing methodology here is a link to the book “Next Generation HALT and HASS: Robust design of Electronics and Systems” written by Kirk Gray and John Paschkewitz.