
Module 7 Comparing Measurement Systems
Lesson M7-02
Duration: 17 minutes
- Measurement System Assessment
- References and Downloads
- M02 MSA Definitions
- M03 Gage R&R Studies
- 1 Overview and Planning for a Gage R&R Study
- 2 Analysis – Average and Range Method
- 3 Setting up and Analyzing a Gage R&R in Minitab
- 4 Exercise – Analyzing a Gage R&R Study
- 5 Analysis – ANOVA Method
- 6 Analyzing a Gage R&R in Minitab (ANOVA Method)
- 7 Exercises – Analyzing Gage R&R Studies (ANOVA)
- 8 Analysis – ANOVA with Significant Interactions
- 9 Gage R&R with Other Factors (Expanded Gage R&R)
- M04 SPC for Measurement Systems
- M05 Linearity & Bias Assessment
- M06 Attribute Systems Assessment
- M07 Comparing Measurement Systems
- M08 Non-Replicable Measurement Systems
Direct Comparisons with Scatter Plots & Regression Modeling
Lesson 2 illustrates direct comparisons of two measurement systems using scatter plots with a 45-degree line. Bias/Differences between the measurement systems may be easily observed based on the location of the paired observations vs. the 45-degree line. Linearity may be assessed by comparing the 45-degree line to a fitted regression line. We discuss how a value observed on one measurement system may be used to predict the value that would be observed on the other measurement system. It may be a constant adjustment or variable adjustment depending on whether the bias/offset depends on the measured value. Prediction intervals are introduced which may be used to quantify the uncertainty in predicted values.
- Measurement System Assessment
- References and Downloads
- M02 MSA Definitions
- M03 Gage R&R Studies
- 1 Overview and Planning for a Gage R&R Study
- 2 Analysis – Average and Range Method
- 3 Setting up and Analyzing a Gage R&R in Minitab
- 4 Exercise – Analyzing a Gage R&R Study
- 5 Analysis – ANOVA Method
- 6 Analyzing a Gage R&R in Minitab (ANOVA Method)
- 7 Exercises – Analyzing Gage R&R Studies (ANOVA)
- 8 Analysis – ANOVA with Significant Interactions
- 9 Gage R&R with Other Factors (Expanded Gage R&R)
- M04 SPC for Measurement Systems
- M05 Linearity & Bias Assessment
- M06 Attribute Systems Assessment
- M07 Comparing Measurement Systems
- M08 Non-Replicable Measurement Systems
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