Implementing a new reliability development paradigm in a company which is using traditional, standards-based testing can be a perilous journey.

It is especially true with introducing HALT (Highly Accelerated Life Test) in which strength against stress, and not quantifying electronics lifetimes is the new metric.  Because of this significant change in test orientation, a critical factor for success begins with educating the company’s top  [Read more…]

It is easy to understand why the term HALT (Highly Accelerated Life Test) is so tightly couple to the equipment called “HALT chambers” systems.  Many do not think they can do HALT processes without a “HALT Chamber”. Many know that Dr. Gregg Hobbs, who coined the term HALT and also HASS (Highly Accelerated Stress Screens), spent much of his life promoting the techniques and was also the founder of two “HALT/HASS” environmental chamber companies. [Read more…]

Many reliability engineers have discovered HALT will quickly find the weaknesses and reliability risks in electronic and electromechanical systems from the capability of thermal cycling and vibration to create rapid mechanical fatigue in electronic assemblies. Assemblies that have latent defects such as cold solder or cracked solder joints, loose connectors or mechanical fasteners, or component package defects can be brought to a detectable, or patent, condition by which we can observe and potentially improve the robustness of an electronics system.

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When we go to an automobile race such as the Indianapolis 500, watching those cars circle the track can get fairly boring. What is secretly unspoken is that everyone observing the race is watching for a race car to find and sometimes exceed a limit, finding a discontinuity. The limit could be how fast he enters a curve before the acceleration forces exceed the tires coefficient of friction, or how close to the racetrack wall, he can be before he contacts it and spins out of control. Using the race analogy, [Read more…]