
Customer Reliability Expectations Change Over Time
Abstract
Kirk and Fred discussing the increased expectations of reliability based on experience with past products
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Your Reliability Engineering Professional Development Site
Author of Accelerated Reliability articles and Next Generation HALT and HASS, plus, co-host on Speaking of Reliability.
This author's archive lists contributions of articles and episodes.

Kirk and Fred discussing the increased expectations of reliability based on experience with past products
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Kirk and Fred discussing the value of reliability in consumer electronics in comparison to the rapid technological improvements.
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Kirk and Fred discussing how to show management and other skeptics of highly accelerated limit testing how valuable it can be in improving reliability.
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Kirk and Fred discussing how to determine when HALT failures are relevant or not relevant to what actually may fail in the field.
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Kirk and Fred discussing the adaptability of a HALT process and what stresses should be included in a HALT evaluation.
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Kirk and Fred discussing the creation of a HALT plan and how to adapt HALT plans based on what is discovered during the HALT process.
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Kirk and Fred discussing the challenge of getting samples to test during product development. Early prototypes of new products are typically scarce, expensive, and in high demand to many engineering teams to test. HALT testing requires pushing the product to operational limits and discovering what will fail which is scary for management and engineers that do not understand the value of information that is discovered with empirical limit tests.

Kirk and Fred discussing the role technical conferences play in your professional development
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Kirk, guest John Paschkewitz, and Fred discussing how DRBFM (Design Review Based on Failure Modes) was developed and how it is similar to FMEA (Failure Modes and Effect Analysis).
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Kirk, guest John Paschkewitz, and Fred discussing the differences and similarities in mechanical HALT testing of motors and degradation testing for wear out modes. Kirk discusses the use of PHM (Prognostics and Health Management) to measure and provide RUL (Remaining Useful Life) estimates during its application.
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Kirk, guest John Paschkewitz, and Fred discussing some of the differences from electronics HALT in applications on mechanical components of a system for reliability development.
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Kirk and Fred discussing the difficulty in getting to root cause of a component failures. In many cases a component failure is not due to a intrinsic failure mechanism in the component, but instead is due to a circuit application issue such as rapid voltage spikes or transients. They also discuss the issues with Li-ion battery failures in Samsung and Boeing leading to costly recalls and failures.
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Kirk and Fred discussing our nature to seek root causes even with home appliances.
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Kirk and Fred discussing the process of HALT on mechanical systems. Many times the simplest and most straightforward of accelerated testing is to increase the number of expected use cycles such as on a mechanical hinge. They discuss how a failure may come from degradation, such as a squeaking door hinge, before it actually has a functional failure.
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