Kirk Gray — Active Contributor

A Tool for the Discovery of Signal Integrity and Software Reliability Issues

Abstract—Failures in the execution of software can have many different causes. Errors in coding, incorrect sequence of software execution, and other factors result in software “bugs” that, when discovered, must be corrected for reliable system operation. However, this paper focuses on another cause of software failures: those that come from variations in the many tiers of component manufacturing and system assembly. This paper shows how applying thermal HALT on electronic circuits, and systems helps skew parametric performance at the circuit board and system levels and increase the probability of discovering marginal signal quality and integrity, which can lead to software operational failures.

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Another one bites the dust!

Apparently, my lovely wife is one of the best at finding stress testing limits of kitchen blenders, or we are unlucky at getting blenders that had some latent defect.  She has discovered the destruct limit of 3 blenders within months of use. She does not do in the formal HALT methodology, as they break in what most would consider normal use conditions. It may have been a valid HALT evaluation if she had started with soft or easy to blend materials, starting with o ice or nuts and measured the time to reach its destruct limit. [Read more…]

Reliability engineers have traditionally been asked to answer a common question during development of a new device or system, and that is “How long will it last?”.

It is the eternal question in equipment reliability development, and it really comes down to “that depends on many factors”. One question that needs to be asked is how long do you need it to, or should it last? [Read more…]

I posted an article recently by Bloomberg on the Defense Department’s recent disclosure of the escalating support cost of the F-35 Joint Fighter Jet. With over 3,700 views, it was the most read of my posts. The original article on escalating F-35 reliability costs can be read at this link

I posted the article with the comment: “Once a test engineer working for a large DoD contractor once told me at a reliability conference, ‘These new reliability development techniques of HALT and HASS would be a lot easier to implement if spare parts and service did not constitute 60% of the total program profits.’ That was not the first time I have heard a similar comment from a test or reliability engineer or manager working in the defense industry. I believe these engineers working on the reliability end of the programs said these concerns me out of frustration. [Read more…]

In all aspects of engineering we only make improvements and innovation in technology by building on previous knowledge. Yet in the field of reliability engineering (and in particular electronics assemblies and systems), sharing the knowledge about field failures of electronics hardware and the true root causes is extremely limited. Without the ability to share data and teach what we know about the real causes of “un-reliability” in the field, it is more easily understood why the belief in the ability able to model and predict the future of electronics life and MTBF continue to dominate the field of electronics reliability

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